Computational method for determining the optical properties and its application for CuIn(S,Se)2 thin films

Abstract

We present in this work a computational method for determining the optical parameters of thin films quaternary CuIn(S,Se)₂ grown by close-spaced vapor transport and the variation of thickness (50 – 325 nm). The analysis of the basic properties of the films was carrie out by spectrophotometer, was measured between 800 – 2500 nm. The modified Abele-Theye method of numerical analysis was used to obtain the optical constant of the film.